

Associate Professor
Keita Yasutomi
In the imaging devices lab, we are carrying out wide ranging research that spans from basic to applied research on new calculation and signal processing algorithms, devices, circuits, and systems related to imaging in order to pursue aggressive performance gains in imaging (image pickup) and to realize unprecedented new functions. In particular, focusing on the great freedoms available in the design of CMOS image sensors, from the design of the pixels to that of the peripheral circuit, we are developing imaging sensors and application systems that harness the power of the latest advances in performance required for scientific measurements such as those needed in life sciences, space science, materials science, industry, medicine and medical care, public infrastructure, transportation equipment, and consumer technology. In addition, all research themes are aimed at device development that will lead to practical applications, and many of the themes are conducted through joint research efforts (industry-academia collaborations, interdisciplinary collaborations) with companies and laboratories at other universities.

- Reducing noise and extending dynamic range of CMOS image sensors
- Improving performance of high speed image sensors (achieving both low noise and high speed, low noise global shutter, ultra high speed)
- Low noise and high resolution column parallel A/D conversion circuits by using multi-sampling technology
- Super high definition and high speed image sensors for the super hi-vision camera (jointed with NHK Science & Technology Research Laboratories)
- High time resolution lock-in pixel image sensor and it’s bio-medical and industrial measurement applications- High-dynamic-range high-backlight-immunity TOF range imagers.
– Time-of-flight (TOF) range image sensor with sub-millimeter resolution
– Improving sensitivity, extending dynamic range and enhancing tolerance for strong ambient light
in TOF range image sensors
– Image sensors having a new function for fluorescence lifetime measurement, near infra-red
spectroscopy, fluorescence correlation spectroscopy and Raman scattering measurement
